Interface test circuitry and methods,申请号EP20070254313-传众专利搜索

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发明名称	Interface test circuitry and methods
摘要
申请公布号	EP1924020(B1)	申请公布日期	2010.09.15
申请号	EP20070254313	申请日期	2007.10.31
申请人	SILICON IMAGE, INC.	发明人	SUL, CHINSONG;KIM, HEON C.;AHN, GIJUNG
分类号	H04L1/24	主分类号	H04L1/24
代理机构		代理人
主权项
地址

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