发明名称 Manufacturing an accelerometer on SOI wafer
摘要 Methods for creating at least one micro-electromechanical (MEMS) structure in a silicon-on-insulator (SOI) wafer 16. The SOI wafer 16 with an extra layer of oxide 24 is etched according to a predefined pattern. A layer of oxide is deposited over exposed surfaces. An etchant selectively removes the oxide to expose the SOI wafer substrate 18. A portion of the SOI substrate under at least one MEMS structure is removed, thereby releasing the MEMS structure to be used in the formation of an accelerometer.
申请公布号 EP2228337(A2) 申请公布日期 2010.09.15
申请号 EP20100153552 申请日期 2010.02.12
申请人 HONEYWELL INTERNATIONAL INC. 发明人 YU, LIANZHONG
分类号 B81C1/00 主分类号 B81C1/00
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