发明名称 APPARATUS FOR WAFER GRINDING AND METHOD FOR THE SAME
摘要 PURPOSE: A wafer grinding apparatus and a method thereof are provided to improve the productivity of polishing by reducing the thickness of a mechanical damage layer generated during a wafer grinding process. CONSTITUTION: An elevation unit(5) elevates a frame(4) for a chuck(9). A rotation motor(2) is installed on a frame to rotate a grinding wheel(1). A supporting member(30) supports inner cases(3a, 3b) to enable sliding. A piezoelectric element member(50) is installed between the rotation motor and the frame.
申请公布号 KR20100100110(A) 申请公布日期 2010.09.15
申请号 KR20090018806 申请日期 2009.03.05
申请人 SILTRON INC. 发明人 MOON, DO MIN;CHO, HEUI DON;KANG, DAE YEOL
分类号 H01L21/304 主分类号 H01L21/304
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