发明名称 |
APPARATUS FOR WAFER GRINDING AND METHOD FOR THE SAME |
摘要 |
PURPOSE: A wafer grinding apparatus and a method thereof are provided to improve the productivity of polishing by reducing the thickness of a mechanical damage layer generated during a wafer grinding process. CONSTITUTION: An elevation unit(5) elevates a frame(4) for a chuck(9). A rotation motor(2) is installed on a frame to rotate a grinding wheel(1). A supporting member(30) supports inner cases(3a, 3b) to enable sliding. A piezoelectric element member(50) is installed between the rotation motor and the frame. |
申请公布号 |
KR20100100110(A) |
申请公布日期 |
2010.09.15 |
申请号 |
KR20090018806 |
申请日期 |
2009.03.05 |
申请人 |
SILTRON INC. |
发明人 |
MOON, DO MIN;CHO, HEUI DON;KANG, DAE YEOL |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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