发明名称 |
Slack-based transition-fault testing |
摘要 |
A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.
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申请公布号 |
US7797601(B2) |
申请公布日期 |
2010.09.14 |
申请号 |
US20090469820 |
申请日期 |
2009.05.21 |
申请人 |
SYNOPSYS, INC. |
发明人 |
KAPUR ROHIT;WILLIAMS TOM W.;HAY CYRUS |
分类号 |
G01R31/28;G01R31/26;G01R31/30;G06F9/45;G11B20/20 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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