发明名称 Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element
摘要 The present invention provides an evaluation method for evaluating whether a light-emitting element material to be evaluated is suitable for a host material or a guest material. By carrying out a first step of measuring absorption intensity of a light-emitting element material and a second step of irradiating the light-emitting element material with light for a predetermined period of time, repeatedly; thereby a change in absorption intensity with time is evaluated so that whether the light-emitting material is suitable for a host material or a guest material can be distinguished. The light emitted to the light-emitting element material preferably has a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material.
申请公布号 US7796240(B2) 申请公布日期 2010.09.14
申请号 US20090396663 申请日期 2009.03.03
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 NOMURA RYOJI;SEO SATOSHI;KOJIMA KUMI;OHSAWA NOBUHARU
分类号 G01B11/16;G01N21/00 主分类号 G01B11/16
代理机构 代理人
主权项
地址