发明名称 |
Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element |
摘要 |
The present invention provides an evaluation method for evaluating whether a light-emitting element material to be evaluated is suitable for a host material or a guest material. By carrying out a first step of measuring absorption intensity of a light-emitting element material and a second step of irradiating the light-emitting element material with light for a predetermined period of time, repeatedly; thereby a change in absorption intensity with time is evaluated so that whether the light-emitting material is suitable for a host material or a guest material can be distinguished. The light emitted to the light-emitting element material preferably has a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material.
|
申请公布号 |
US7796240(B2) |
申请公布日期 |
2010.09.14 |
申请号 |
US20090396663 |
申请日期 |
2009.03.03 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
NOMURA RYOJI;SEO SATOSHI;KOJIMA KUMI;OHSAWA NOBUHARU |
分类号 |
G01B11/16;G01N21/00 |
主分类号 |
G01B11/16 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|