发明名称 Semiconductor structure and fabrication method thereof
摘要 The invention provides a method for forming a semiconductor structure. A plurality of first type well regions is formed in the first type substrate. A plurality of second type well regions and a plurality of second type bar doped regions are formed in the first type substrate by a doping process using a mask. The second type bar doped regions are diffused to form a second type continuous region by annealing. The second type continuous region is adjoined with the first type well regions. A second type dopant concentration of the second type continuous region is smaller than a second type dopant concentration of the second type bar doped regions. A second type source/drain region is formed in the second type well region.
申请公布号 US7795083(B2) 申请公布日期 2010.09.14
申请号 US20090371879 申请日期 2009.02.16
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 TSAI HUNG-SHERN;TU SHANG-HUI;LIN SHIN-CHENG
分类号 H01L21/337 主分类号 H01L21/337
代理机构 代理人
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