发明名称 |
Semiconductor structure and fabrication method thereof |
摘要 |
The invention provides a method for forming a semiconductor structure. A plurality of first type well regions is formed in the first type substrate. A plurality of second type well regions and a plurality of second type bar doped regions are formed in the first type substrate by a doping process using a mask. The second type bar doped regions are diffused to form a second type continuous region by annealing. The second type continuous region is adjoined with the first type well regions. A second type dopant concentration of the second type continuous region is smaller than a second type dopant concentration of the second type bar doped regions. A second type source/drain region is formed in the second type well region.
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申请公布号 |
US7795083(B2) |
申请公布日期 |
2010.09.14 |
申请号 |
US20090371879 |
申请日期 |
2009.02.16 |
申请人 |
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
TSAI HUNG-SHERN;TU SHANG-HUI;LIN SHIN-CHENG |
分类号 |
H01L21/337 |
主分类号 |
H01L21/337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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