发明名称 Finned memory cells
摘要 For an embodiment, a memory array has a plurality fins protruding from a substrate. A tunnel dielectric layer overlies the fins. A plurality floating gates overlie the tunnel dielectric layer, and the floating gates correspond one-to-one with the fins protruding from the substrate. An intergate dielectric layer overlies the floating gates. A control gate layer overlies the intergate dielectric layer. Each fin includes an upper surface rounded by isotropic etching.
申请公布号 US7795664(B2) 申请公布日期 2010.09.14
申请号 US20080257100 申请日期 2008.10.23
申请人 MICRON TECHNOLOGY, INC. 发明人 ARITOME SEIICHI
分类号 H01L29/76;H01L21/8238 主分类号 H01L29/76
代理机构 代理人
主权项
地址