发明名称 |
On-chip frequency response measurement |
摘要 |
A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.
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申请公布号 |
US7797131(B2) |
申请公布日期 |
2010.09.14 |
申请号 |
US20070844393 |
申请日期 |
2007.08.24 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
SINGH DEEPAK K.;ATALLAH FRANCOIS IBRAHIM;SEMAN DAVID JOHN |
分类号 |
G06F19/00;G06F17/40 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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