发明名称 Semiconductor device and method of fabricating the same
摘要 A method of fabricating a semiconductor device is provided. First, a first electrode is formed over a first region of a substrate. Then, a dielectric layer covering the first electrode is formed over the substrate. After that, a plurality of openings is formed on the first region of the substrate. Thereafter, a conductive layer covering the dielectric layer and the openings is formed over the substrate. Then, the conductive layer in the bottom of the openings is removed to form second electrodes. After that, the dielectric layer between the second electrode and the first electrode is removed.
申请公布号 US7795056(B2) 申请公布日期 2010.09.14
申请号 US20080132106 申请日期 2008.06.03
申请人 UNITED MICROELECTRONICS CORP. 发明人 SHIH HUI-SHEN
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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