| 摘要 |
<p>An electrical probe assembly includes a first probe housing (14) pivotally connected to a base structure (24) and receiving a first probe (18) therein. The first probe is configured to interface with a first contact of an electrical component. A second probe housing (16) is pivotally connected to the base structure and receives a second probe (20) therein. The second probe is configured to interface with a second contact of the electrical component wherein the first and second contacts have a spatial relationship therebetween. An adjustment mechanism (32) is connected to the first and second housing and configured to independently adjust an amount of rotation of the each of the housings to accommodate the spatial relationship.</p> |
