HIGH RESOLUTION LASER SCANNING MICROSCOPY IMAGING SYSTEM AND METHOD USING SPATIALLY PATTERNED CUMULATIVE ILLUMINATION OF DETECTION FIELDS

摘要

A method is disclosed for performing high-resolution microscopy. The method includes the steps of providing an illumination beam, selectively directing and focusing the illumination beam substantially toward a first of a plurality of spots in a sample volume, receiving a first radiation signal from the sample volume at a wide field array detector, scanning the illumination beam such that the illumination beam moves from being substantially directed toward the first of the plurality of sports in the sample volume to be substantially directed toward a second of the plurality of spots in the sample volume, directing the illumination beam substantially toward the second of the plurality of spots in the sample volume, and receiving a second radiation signal from the sample volume at the wide field array detector.