摘要 |
<p>The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50nm bandwidth, where a portion of the conditioned light source 5 is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current 0 and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.</p> |
申请人 |
TAU SCIENCE CORPORATION;ARBORE, MARK, A.;KLEIN, DAVID, L.;VASILYEV, LEONID, A.;SCHMIDT, JOHN, M.;HUDSON, JAMES, E.;HORNER, GREGORY, S. |
发明人 |
ARBORE, MARK, A.;KLEIN, DAVID, L.;VASILYEV, LEONID, A.;SCHMIDT, JOHN, M.;HUDSON, JAMES, E.;HORNER, GREGORY, S. |