发明名称 SEMICONDUCTOR SENSOR AND THE MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor sensor and a method for manufacturing the same are provided to vary the shape and the dimension of an insulating layer, which is remained on the periphery of a sensing region, by regulating a timing point for converting a rapid etching operation to a slow etching operation. CONSTITUTION: A first semiconductor layer(22) is formed. An insulating layer(23) is formed on the first semiconductor layer. A second semiconductor layer(24) is formed on the insulating layer. A concave part(26) from the lower side of the first semiconductor layer to the upper side of the insulating layer is formed. The sensing region of the second semiconductor layer(25) is exposed excluding the upper periphery of the concave part.
申请公布号 KR20100099045(A) 申请公布日期 2010.09.10
申请号 KR20100005909 申请日期 2010.01.22
申请人 OMRON CORPORATION 发明人 ADACHI YOSHITAKA;INOUE KATSUYUKI
分类号 H01L29/84;H01L21/20;H01L27/12 主分类号 H01L29/84
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