| 摘要 |
Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.
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