发明名称 Continuity testing apparatus and continuity testing method including open/short detection circuit
摘要 A continuity testing apparatus includes open/short detection circuits provided for to-be-tested terminals, respectively and configured to determine the presence or absence of at least any one of an open-circuit failure and a short-circuit failure in to-be-tested terminals. Then, the continuity testing apparatus generates detected results of the open/short detection circuits based on the condition of continuity of the to-be-tested terminals having connections to the open/short detection circuits and the detected results from the open/short detection circuits in the preceding stages, and outputs the generated detected results to the open/short detection circuits in the succeeding stages. Further, the continuity testing apparatus determines the condition of continuity based on the output from the open/short detection circuit in the last stage.
申请公布号 US2010225331(A1) 申请公布日期 2010.09.09
申请号 US20100659342 申请日期 2010.03.04
申请人 NEC ELECTRONICS CORPORATION 发明人 FUCHIGAMI HIROYUKI;SATOU SHOUICHIROU
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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