| 摘要 |
A method of generating multi-frame test signals, a testing apparatus, and method for testing integrated circuits (ICs) with the multi-frame test signals. An analog source generates an analog source signal at a constant power and a constant frequency that is modulated with a first modulating signal (e.g., I) to output a first test signal having first signal parameters including a power level, a frequency and a modulation scheme. The modulating is repeated with a second modulating signal (e.g., Q) to output a second test signal having second signal parameters including a power level, a frequency and a modulation scheme. At least one of the first and second signal parameters are different. The modulating signals are generated by a digital signal source. The first and second test signal are combined by placing the first test signal on the first frame (frame 1) and the second test signal on the second frame (frame 2) of the multi-frame test signal.
|
