发明名称 APPARATUS, SYSTEM AND METHOD FOR DETECTING DEFECTS IN BUILDING STRUCTURES
摘要 An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced.
申请公布号 US2010225341(A1) 申请公布日期 2010.09.09
申请号 US20100716461 申请日期 2010.03.03
申请人 SMT RESEARCH LTD. 发明人 BURROWS ALISTAIR C.;BUZUNIS CHRIS;CHEN GEOFFREY;JAMAN GREGORY P.;LIAO STEPHEN;MUSTAPHA GAMAL K.;RAMCHANDAR RYAN;TEETAERT JASON G.
分类号 G01N27/20;G01R27/08;G06F19/00 主分类号 G01N27/20
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