SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

摘要

PROBLEM TO BE SOLVED: To detect a delay failure in a logic between a memory macro and a user logic circuit. SOLUTION: The semiconductor device includes: the memory macro; an input side test circuit selecting either one of an output from an input side user logic circuit and an output from a scan flip-flop to input it to the memory macro and taking the output from the input side user logic circuit into the scan flip-flop; and an output side test circuit selecting either one of an output from the memory macro and an output from the scan flip-flop to input it to an output side user logic circuit and taking the output from the memory macro into the scan flip-flop. COPYRIGHT: (C)2010,JPO&INPIT