发明名称 PARTICULATE FOREIGN MATERIAL INSPECTING DEVICE, AND METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a particulate foreign material inspecting device, capable of easily and accurately adjusting the inclination of the line imaging section of a color line imaging device and the axis direction of a rotating drum. SOLUTION: The particulate foreign material inspecting device includes a particulate-conveying mechanism 3 for leveling particulates, while conveying; a translucent rotating drum 11 for receiving particulates dropped from the particulate conveying mechanism with a circumference surface and conveying to a sliding down position; an illumination mechanism 13 for illuminating in a linear illumination region 12, that extends at least the rotating drum in the axial direction between the particulate dropping position of the rotating drum 11 and the sliding down position; a color line imaging device 14 for picking up the linear illumination region 12; and a device for detecting the inclination of an imaging device that detects at least the inclination of the color line imaging device 14, based on a calibration member indicating an inclination detecting pattern removably mounted on the circumference surface of the rotating drum 11 and the color image information picked up by the color line imaging device 14, in a state where the calibration member is mounted on the rotating drum. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010197240(A) 申请公布日期 2010.09.09
申请号 JP20090042978 申请日期 2009.02.25
申请人 FUJI ELECTRIC SYSTEMS CO LTD 发明人 MORII TAKASHI;CHAZONO YUKI;INOUE AKINORI
分类号 G01N21/85;G01B11/26;G01V8/10 主分类号 G01N21/85
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