发明名称 Method for testing solar cell surfaces, particularly for detecting deposits of contact material on solar cell substrate, involves applying inverse voltage at solar cell
摘要 <p>The method (100) involves applying (101) an inverse voltage at a solar cell. An area is selected (103) on a surface of the solar cell, on which the formation of contacts is not provided by a contact material. The electromagnetic radiation is detected (105) spectrally or temporally in solution.</p>
申请公布号 DE102009003544(A1) 申请公布日期 2010.09.09
申请号 DE20091003544 申请日期 2009.02.26
申请人 Q-CELLS SE 发明人 LAUSCH, DOMINIK;PETTER, KAI;CLEMENS, PATRICK;BAKOWSKIE, RONNY
分类号 G01N21/66;H01L31/18 主分类号 G01N21/66
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