发明名称 |
Method for testing solar cell surfaces, particularly for detecting deposits of contact material on solar cell substrate, involves applying inverse voltage at solar cell |
摘要 |
<p>The method (100) involves applying (101) an inverse voltage at a solar cell. An area is selected (103) on a surface of the solar cell, on which the formation of contacts is not provided by a contact material. The electromagnetic radiation is detected (105) spectrally or temporally in solution.</p> |
申请公布号 |
DE102009003544(A1) |
申请公布日期 |
2010.09.09 |
申请号 |
DE20091003544 |
申请日期 |
2009.02.26 |
申请人 |
Q-CELLS SE |
发明人 |
LAUSCH, DOMINIK;PETTER, KAI;CLEMENS, PATRICK;BAKOWSKIE, RONNY |
分类号 |
G01N21/66;H01L31/18 |
主分类号 |
G01N21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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