发明名称 |
Verfahren zur Herstellung einer Schablonenmaske |
摘要 |
Disclosed herein is a method of fabricating a stencil mask to be used in an E-beam lithographic process. The method comprises, after forming a silicon nitride film over the entire surface of a wafer, a step of dividing the silicon nitride film into at least two sub-portions to form silicon nitride film patterns. A stress applied to the silicon nitride film is thus reduced. |
申请公布号 |
DE19945170(B4) |
申请公布日期 |
2010.09.09 |
申请号 |
DE1999145170 |
申请日期 |
1999.09.21 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO. LTD. |
发明人 |
KIM, CHEOL KYUN |
分类号 |
G03F1/16;H01L21/027;G03F1/14;G03F1/20 |
主分类号 |
G03F1/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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