发明名称 Verfahren zur Herstellung einer Schablonenmaske
摘要 Disclosed herein is a method of fabricating a stencil mask to be used in an E-beam lithographic process. The method comprises, after forming a silicon nitride film over the entire surface of a wafer, a step of dividing the silicon nitride film into at least two sub-portions to form silicon nitride film patterns. A stress applied to the silicon nitride film is thus reduced.
申请公布号 DE19945170(B4) 申请公布日期 2010.09.09
申请号 DE1999145170 申请日期 1999.09.21
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO. LTD. 发明人 KIM, CHEOL KYUN
分类号 G03F1/16;H01L21/027;G03F1/14;G03F1/20 主分类号 G03F1/16
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