发明名称 |
ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, AND PATTERN FORMING METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an active light sensitive or a radiation sensitive resin composition which provides a fine pattern superior in exposure latitude and a pattern form, and to provide a pattern forming method using the same. <P>SOLUTION: The active light sensitive or the radiation sensitive resin composition contains (A) a resin that has a repeating unit including structure represented by general formula (1) and a repeating unit including structure represented by general formula (I) and increases solubility in an alkali developing solution by the action of an acid, and (B) a compound that produces an acid by active light or radiation irradiation. Wherein, codes in formulas (1) and (I) represent differential meanings. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010197615(A) |
申请公布日期 |
2010.09.09 |
申请号 |
JP20090041352 |
申请日期 |
2009.02.24 |
申请人 |
FUJIFILM CORP |
发明人 |
SHIBUYA AKINORI;YAMAGUCHI SHUHEI;YOSHIDA YUKO;SHIRAKAWA MICHIHIRO |
分类号 |
G03F7/039;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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