发明名称 LIGHT-RESISTANCE TESTING EQUIPMENT AND LIGHT-RESISTANCE TESTING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide light-resistance testing equipment for preventing the damage of a sample while achieving the shortening of the testing time required in a light-resistance test. Ž<P>SOLUTION: The light-resistance testing equipment 1 includes a laser 18 emitting a laser beam to the sample, a light detecting element 14 detecting the laser beam transmitted through the sample, and a control part 16 calculating the light transmittance of the sample on the basis of the quantity of the light emitted from the laser 18 and the quantity of the laser beam detected by the light detecting element 14 and controlling a light source. Since the light source is controlled so that the sample is irradiated with a laser beam having second intensity higher than first intensity when the light transmittance is larger than a predetermined threshold value, the testing time is shortened and, since the light source is controlled so that the sample is irradiated with a laser beam having the first intensity when the light transmittance of the sample is deteriorated to become the predetermined threshold value or below, damage such as melting or the like is prevented from being produced in the sample by absorbing the energy of the laser beam. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010197145(A) 申请公布日期 2010.09.09
申请号 JP20090040873 申请日期 2009.02.24
申请人 FUJINON CORP 发明人 TAKAHASHI SHUSUKE
分类号 G01N17/00;G01M11/02 主分类号 G01N17/00
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