| 摘要 |
PROBLEM TO BE SOLVED: To provide a high-frequency material constant measurement system that facilitates measuring material characteristics, such as permittivity, of a sample to be measured having dimensions fully smaller than a wavelength for a wideband frequency without any strict requirement of mechanical machining precision. SOLUTION: In free air space, a material to be measured is installed in a radiation electric field having an arbitrary frequency and known strength generated by a transmission antenna, and a scattered wave electric field generated by the dielectric polarization is measured by a reception antenna installed at a known far distance. The high-frequency dielectric constant of the sample is estimated, based on the fact that electric field strength by the scattered wave is in a relationship determined uniquely with the dielectric constant of the sample to be measured, namely a scatterer. COPYRIGHT: (C)2010,JPO&INPIT |
