发明名称 Method of measuring amount of eccentricity
摘要 An optical element to be measured is irradiated with the light which has passed through an indicator, thereby to form an indicator image on an image pick-up surface. Maximum peak coordinates are specified and stored as a position of the indicator image relating to the first surface. Whether the second largest peak may be specified or not is determined. In case that this result is NO, the maximum peak indicator image is deleted, and maximum peak coordinates are specified again and stored as a position of the indicator image relating to the second surface.
申请公布号 US7792366(B1) 申请公布日期 2010.09.07
申请号 US20100732836 申请日期 2010.03.26
申请人 FUJINON CORPORATION 发明人 GE ZONGTAO;TAKAHASHI KENICHI
分类号 G06K9/62;G01B9/00 主分类号 G06K9/62
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