发明名称 Inspection apparatus
摘要 An inspection apparatus includes a movable mounting table having a temperature control device, an elevation drive unit for vertically moving the mounting table, a controller for controlling the elevation drive unit and a probe card having probes arranged above the mounting table. The elevation drive unit includes first and second driving shafts connected to each other through coupling members to drive the mounting table, a motor for driving the first and second driving shafts, and a torque detection unit for detecting a torque between the first and second driving shafts based on a contact load between the probes and the at least one device. The controller includes a torque controller for controlling the torque based on detection results of the torque detection unit when the probe card expands or contracts due to temperature variation.
申请公布号 US7791362(B2) 申请公布日期 2010.09.07
申请号 US20080333644 申请日期 2008.12.12
申请人 TOKYO ELECTRON LIMITED 发明人 HAGIHARA JUNICHI
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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