发明名称 Thin film transistor and manufacturing method thereof, and display device and manufacturing method thereof
摘要 To provide a manufacturing method of a thin film transistor and a display device with fewer masks than a conventional method. A thin film transistor is manufactured by including the steps of: forming a first conductive film, an insulating film, a semiconductor film, an impurity semiconductor film, and a second conductive film to be stacked; forming a resist mask including three regions with different thicknesses; performing first etching to form a thin-film stack body; performing second etching in which side-etching is performed on the thin-film stack body to form a gate electrode layer; and recessing the resist mask to form a semiconductor layer and a source and drain electrode layer. A resist mask including three regions with different thicknesses can be formed using a four-tone photomask, for example.
申请公布号 US7790483(B2) 申请公布日期 2010.09.07
申请号 US20090473776 申请日期 2009.05.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYAIRI HIDEKAZU;KOMATSU RYU
分类号 H01L21/00;G02F1/1368;H01L21/336;H01L29/417;H01L29/423;H01L29/49;H01L29/786;H01L51/50 主分类号 H01L21/00
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