发明名称 |
Thin film transistor and manufacturing method thereof, and display device and manufacturing method thereof |
摘要 |
To provide a manufacturing method of a thin film transistor and a display device with fewer masks than a conventional method. A thin film transistor is manufactured by including the steps of: forming a first conductive film, an insulating film, a semiconductor film, an impurity semiconductor film, and a second conductive film to be stacked; forming a resist mask including three regions with different thicknesses; performing first etching to form a thin-film stack body; performing second etching in which side-etching is performed on the thin-film stack body to form a gate electrode layer; and recessing the resist mask to form a semiconductor layer and a source and drain electrode layer. A resist mask including three regions with different thicknesses can be formed using a four-tone photomask, for example.
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申请公布号 |
US7790483(B2) |
申请公布日期 |
2010.09.07 |
申请号 |
US20090473776 |
申请日期 |
2009.05.28 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
MIYAIRI HIDEKAZU;KOMATSU RYU |
分类号 |
H01L21/00;G02F1/1368;H01L21/336;H01L29/417;H01L29/423;H01L29/49;H01L29/786;H01L51/50 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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