发明名称 Plating method
摘要 A method of forming an electrode on a semiconductor wafer by plating is disclosed that is able to reliably prevent leakage of a plating solution during the plating process. The plating method comprises the steps of forming a conductive layer on a semiconductor wafer; forming a negative resist layer on the conductive layer; exposing a center portion of the negative resist layer; exposing a peripheral region of the negative resist layer after the step of exposing the center portion of the negative resist layer; developing the exposed negative resist layer to form a predetermined plating pattern; and performing plating on the plating pattern.
申请公布号 US7790359(B2) 申请公布日期 2010.09.07
申请号 US20050072724 申请日期 2005.03.04
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 YAMANO TAKAHARU
分类号 C25D7/12;H01L21/00;C25D5/02;G03F7/00;H01L21/027;H01L21/28;H01L21/3205;H01L21/44 主分类号 C25D7/12
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