发明名称 ERASING METHOD OF NONVOLATILE MEMORY DEVICE AND READING METHOD THEREOF
摘要 PURPOSE: An erasing method of a nonvolatile memory device and a read-out method thereof are provided to generate a modified read-out voltage by adding a maximum read-out verification voltage to a read-out voltage when a read-out verification voltage difference is less than a predetermined value. CONSTITUTION: A memory device executes an erase operation based on an erase voltage(S21). The memory device verifies a verification voltage of 0V(S22). The pass state of a verification operation is determined(S23). The erase operation is completed during the pass state of the verification operation. A proper erase voltage for the completion of the erase operation is searched by using a binary search method(S24). The memory device executes the erase operation based on the erase voltage which is searched with the binary search method.
申请公布号 KR20100097964(A) 申请公布日期 2010.09.06
申请号 KR20090016872 申请日期 2009.02.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOUN, DONG KYU
分类号 G11C16/14;G11C16/34 主分类号 G11C16/14
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