发明名称 |
ERASING METHOD OF NONVOLATILE MEMORY DEVICE AND READING METHOD THEREOF |
摘要 |
PURPOSE: An erasing method of a nonvolatile memory device and a read-out method thereof are provided to generate a modified read-out voltage by adding a maximum read-out verification voltage to a read-out voltage when a read-out verification voltage difference is less than a predetermined value. CONSTITUTION: A memory device executes an erase operation based on an erase voltage(S21). The memory device verifies a verification voltage of 0V(S22). The pass state of a verification operation is determined(S23). The erase operation is completed during the pass state of the verification operation. A proper erase voltage for the completion of the erase operation is searched by using a binary search method(S24). The memory device executes the erase operation based on the erase voltage which is searched with the binary search method.
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申请公布号 |
KR20100097964(A) |
申请公布日期 |
2010.09.06 |
申请号 |
KR20090016872 |
申请日期 |
2009.02.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOUN, DONG KYU |
分类号 |
G11C16/14;G11C16/34 |
主分类号 |
G11C16/14 |
代理机构 |
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主权项 |
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地址 |
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