发明名称 |
Probe for infrared spectroscopy application, has optical element with contact surface on outer circumference, where layer is provided at circumference and optical element is held by pressing element transverse to axis of probe head |
摘要 |
<p>The probe has an optical element (3) with a circular contact surface (3.1) on an outer circumference. A thin-walled intermediate layer (4) made of flexible and/or ductile material e.g. gold or Teflon(RTM: PTFE), is provided at the circumference. The optical element is held by a radial pressing element (5) transverse to an axis of a tubular probe head (1). A ring attachment piece (1.1) is formed at the head on the circumference and pressed by the pressing element radially inward against the layer. The optical element is formed as a conical silicon crystal or diamond.</p> |
申请公布号 |
DE102009010541(A1) |
申请公布日期 |
2010.09.02 |
申请号 |
DE20091010541 |
申请日期 |
2009.02.25 |
申请人 |
MMT MICRO MECHATRONIC TECHNOLOGIES GMBH |
发明人 |
HEMPELMANN, WILLI |
分类号 |
G01N21/35 |
主分类号 |
G01N21/35 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|