| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an X-ray analysis apparatus capable of condensing X rays without lowering the intensity when irradiating a minute area with the X rays. Ž<P>SOLUTION: The apparatus includes: an X-ray source 1; a first X-ray converting plate 2 for converting the X-rays emitted by the X ray source 1 into a parallel-ray bundle; a second X-ray converting plate 3 for condensing the bundled parallel-ray having passed through the first X-ray converting plate 2 on to a sample position; and a detector 4 for detecting secondary X rays emitted by a sample which is placed on the sample position and irradiated with the condensed X rays. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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