发明名称 TRANSISTOR, TRANSISTOR MANUFACTURING METHOD, AND MANUFACTURING DEVICE THEREOF
摘要 <p>Provided are a transistor and a manufacturing method thereof with which variations in the electrical conductivity of an active layer can be suppressed and responsiveness can be improved while assuring the gate withstand voltage. The transistor is provided with a gate insulating film (14) having a laminated structure, which comprises a first insulating layer (14A) made of a silicon nitride film and a second insulating layer (14B) made of a silicon oxide film between a gate electrode (11) made of copper and an active layer (15) made of an oxide semiconductor. The second insulating layer (14B) prevents fluctuation in the electrical conductivity of the active layer (15) caused by the interfacial reaction between the first insulating layer (14A) and the active layer (15). The first insulating layer (14A) functions as a barrier layer for preventing dispersion of the copper atoms which constitute the gate electrode (11) into the second insulating layer (14B).</p>
申请公布号 WO2010098101(A1) 申请公布日期 2010.09.02
申请号 WO2010JP01270 申请日期 2010.02.25
申请人 ULVAC, INC.;TAKEI, MASAKI;AKAMATSU, YASUHIKO;KOBAYASHI, MOTOSHI;YUKAWA, TOMIYUKI;KIYOTA, JUNYA;ISHIBASHI, SATORU;SHIMIZU, MIHO;KURATA, TAKAOMI;NAKAMURA, KYUZO 发明人 TAKEI, MASAKI;AKAMATSU, YASUHIKO;KOBAYASHI, MOTOSHI;YUKAWA, TOMIYUKI;KIYOTA, JUNYA;ISHIBASHI, SATORU;SHIMIZU, MIHO;KURATA, TAKAOMI;NAKAMURA, KYUZO
分类号 H01L29/786;H01L21/28;H01L21/31;H01L21/336;H01L29/423;H01L29/49 主分类号 H01L29/786
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