发明名称 |
METHOD AND DEVICE FOR DIAGNOSING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus diagnostic method for easily setting an apparatus to be an object of diagnosis with satisfactory accuracy. SOLUTION: An apparatus representative to be selected as an object of diagnosis in a plant is designated by an object apparatus selecting device 7 (step 21). Apparatuses located within a set distance from the designated apparatus, are extracted out of a plurality of apparatuses connected with the designated apparatus (step 22). Information on a process value corresponding to each of the extracted apparatuses is obtained (step 23). A correlation value of each process value for each of the extracted apparatuses is calculated (step 24). This is performed in an apparatus correlation determination device 5. A combination of apparatuses whose absolute values of correlation values are not lower than a set value is grouped as a group of apparatuses to be used for diagnosis (step 25). Malfunction diagnosis for each apparatus in the group is performed by using the process value (step 26). Information on the obtained diagnostic results is output from an apparatus state diagnostic device 6 to a diagnostic result output device 8 (step 27). COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010190582(A) |
申请公布日期 |
2010.09.02 |
申请号 |
JP20090032167 |
申请日期 |
2009.02.16 |
申请人 |
HITACHI-GE NUCLEAR ENERGY LTD |
发明人 |
KANEDA MASAKI;FUSHIMI ATSUSHI |
分类号 |
G01D21/00;G01M99/00 |
主分类号 |
G01D21/00 |
代理机构 |
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