发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICES INCLUDING GATE PATTERNS HAVING STEP DIFFERENCE THEREBETWEEN AND A CONNECTION LINE DISPOSED BETWEEN THE GATE PATTERNS AND METHODS OF FABRICATING THE SAME
摘要 Provided are semiconductor integrated circuit (IC) devices including gate patterns having a step difference therebetween and a connection line interposed between the gate patterns. The semiconductor IC device includes a semiconductor substrate including a peripheral active region, a cell active region, and a device isolation layer. Cell gate patterns are disposed on the cell active region and the device isolation layer. A peripheral gate pattern is disposed on the peripheral active region. A cell electrical node is disposed on the cell active region adjacent to the cell gate patterns. Peripheral electrical nodes are disposed on the peripheral active region adjacent to the peripheral gate pattern. Connection lines are disposed on the cell gate patterns disposed on the device isolation layer. The connection lines are connected between the cell gate patterns and the peripheral gate pattern.
申请公布号 US2010221875(A1) 申请公布日期 2010.09.02
申请号 US20100781859 申请日期 2010.05.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM BONG-SOO;HONG HYEONG-SUN;SHIN SOO-HO;RYU HO-IN
分类号 H01L21/82 主分类号 H01L21/82
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