发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device including a gate insulating film which can be formed into a thin film and in which film composition control is easy. SOLUTION: The manufacturing method includes steps of: forming a manganese oxide film 12 serving as a gate insulating film on a semiconductor substrate 1 on which a transistor is formed; forming a conductive film 13 serving as a gate electrode on the manganese oxide film 12; and forming a gate electrode 13 and a gate insulating film 12 by forming the conductive film 13 and the manganese oxide film 12. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010192766(A) |
申请公布日期 |
2010.09.02 |
申请号 |
JP20090037062 |
申请日期 |
2009.02.19 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
SATO HIROSHI;MATSUMOTO KENJI;ITO HITOSHI |
分类号 |
H01L29/78;H01L21/31;H01L21/316;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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