发明名称 Structure With PN Clamp Regions Under Trenches
摘要 A structure that includes a rectifier further comprises a semiconductor region of a first conductivity type, and trenches that extend into the semiconductor region. A dielectric layer lines lower sidewalls of each trench but is discontinuous along a bottom of each trench. A silicon region of a second conductivity type extends along the bottom of each trench and forms a PN junction with the semiconductor region. A shield electrode in a bottom portion of each trench is in direct contact with the silicon region. A gate electrode extends over the shield electrode. An interconnect layer extends over the semiconductor region and is in electrical contact with the shield electrode. The interconnect layer further contacts mesa surfaces of the semiconductor region between adjacent trenches to form Schottky contacts therebetween.
申请公布号 US2010219461(A1) 申请公布日期 2010.09.02
申请号 US20100779844 申请日期 2010.05.13
申请人 RINEHIMER MARK 发明人 RINEHIMER MARK
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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