发明名称 CHITIN CRYSTALLINITY MEASUREMENT DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a chitin crystallinity measurement device for measuring a chitin crystallinity on real time, particularly a chitin crystallinity measurement device for speedily measuring on line and feeding back to grinders or conveyers. <P>SOLUTION: The chitin crystallinity measurement device includes a light source lamp 11 irradiating a chitin powder sample 2 with near-infrared light, an infrared sensor 12 detecting a light amount of the near-infrared light entering from the sample, a memory 16 recording a calibration curve prepared in advance, and calculation devices 17, 18 calculating a chitin crystallinity based on a detected result and the calibration curve, in which a near-infrared spectrum is obtained on the basis of the detected result of the infrared sensor 12, a secondary differentiation of the near-infrared spectrum is obtained as a transformed spectrum, and the chitin crystallinity is estimated by comparing an intensity of the transformed spectrum within a predetermined wavelength range with the calibration curve. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010190746(A) 申请公布日期 2010.09.02
申请号 JP20090035741 申请日期 2009.02.18
申请人 INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY JAPAN;EARTH TECHNICA:KK 发明人 KAIHARA MIKIO;TOTANI KAZUHIDE;NIKAIDO MITSURU;INOMATA NAOHARU
分类号 G01N21/35;G01N21/359 主分类号 G01N21/35
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