| 摘要 |
PURPOSE: A rotation apparatus of sample for TEM analysis is provided to reduce an error rate on a analyzed sample processing by rotating a simple and by moving a pattern to a lower position. CONSTITUTION: A rotation apparatus of sample for TEM analysis comprises a holder body(50), an operation bar(60) and an adhering member. The holder body comprises a fixed head and plate. The plate is into one body formed with the fixed head. An adhering member fixing the analyzed sample passes through the fixing cavity. The axis hole is perpendicularly formed in the central part of the fixed head. A space part(30) is formed between the plate and plate.
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