发明名称 APPARATUS FOR PROBING FLAT PANEL DISPLAY
摘要 PURPOSE: A probe device for the inspection of a flat display is provided to accurately measure the correlation due to temperature and light. CONSTITUTION: A thermo stream injecting unit(6) is installed in a probe head. The unit heats and cools the contact unit of a probe pin and a circuit pattern. A plurality of backlight modules(7) irradiate light to the back side of a substrate and irradiate light to the circuit pattern. A controller(9) outputs the temperature measuring time point of a substrate by calculating the correlation of specific temperature by a thermostream spraying part and the reference temperature of a measurement point.
申请公布号 KR20100095866(A) 申请公布日期 2010.09.01
申请号 KR20090014880 申请日期 2009.02.23
申请人 YANG ELECTRONIC SYSTEMS CO., LTD. 发明人 KIM, JONG MOON;CHO, WON IL;LEE, JUNG MIN;LEE, WON KYU
分类号 G01R1/073;G01R31/28;G02F1/13 主分类号 G01R1/073
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