发明名称 CHAMBER OF SCANNING ELECTRON MICROSCOPE
摘要 PURPOSE: A sample chamber for a scanning electronic microscope is provided to rapidly and conveniently exchange samples by opening an inlet of the sample chamber using an automatic chamber door. CONSTITUTION: A sample chamber(30) for a scanning electronic microscope comprises a chamber door(100). An inlet(130) is formed on one surface of the sample chamber. The chamber door automatically opens and closes the inlet. The chamber door has a cylinder(110) and a piston(120). The cylinder is fixed to the sample chamber. The piston is moved by pressure supplied to the cylinder. One end of the piston is connected to the chamber door, and the inlet of the sample chamber is opened and closed.
申请公布号 KR20100095668(A) 申请公布日期 2010.09.01
申请号 KR20090011638 申请日期 2009.02.12
申请人 SEOUL NATIONAL UNIVERSITY OF TECHNOLOGY CENTER FOR INDUSTRY COLLABORATION;KOOKMIN UNIVERSITY INDUSTRY ACADEMY COOPERATION FOUNDATION 发明人 KIM, DONG HWAN;YANG, HEE NAM;JANG, DONG YOUNG;IM, HONG JAE
分类号 G01N1/36;G01N35/10;H01J37/26 主分类号 G01N1/36
代理机构 代理人
主权项
地址