发明名称 |
Multilayer type test board assembly for high-precision inspection |
摘要 |
There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and including at least one test board each having a first section where first mounting devices sensitive to an influence of electrical signals are mounted and a second section where second mounting devices insensitive to an influence of electrical signals are mounted; spacers that arrange the test boards in parallel by spacing apart the test boards by predetermined intervals; connection cables connected to the input/output signal terminals of the test boards; and a signal shielding fence formed on each of the at least one test board so as to protect the first mounting devices from electrical signals generated by the second mounting devices.
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申请公布号 |
US7786721(B2) |
申请公布日期 |
2010.08.31 |
申请号 |
US20080006543 |
申请日期 |
2008.01.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM MIN-GU;AN YOUNG-SOO;CHOI HO-JEONG;KIM JUNG-HYEON |
分类号 |
G01R31/28;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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