发明名称 Dual image sensor and manufacturing method thereof
摘要 Embodiments relate to a dual image sensor which includes a first device including a first wafer having a first inclined step, a first reflective face on an inclined plane on the first inclined step, at least one first microlens over a lower end surface adjacent the first inclined step, and a first via-hole filled with metal on an upper end face adjacent the first inclined step. A second device in the dual image sensor includes a second wafer having a second inclined step, a second reflective face on an inclined plane on the second inclined step, and at least one second microlens over a first portion of an upper end face adjacent the second inclined step. A dual image sensor is formed by connecting the metal in the first via-hole and the metal in the second via-hole together. The dual image sensor is capable of imaging light incident from one or both sides as well as light incident in front or rear of the image sensor.
申请公布号 US7786542(B2) 申请公布日期 2010.08.31
申请号 US20080233646 申请日期 2008.09.19
申请人 DONGBU HITEK CO., LTD. 发明人 YOON JOON-KU
分类号 H01L31/0232 主分类号 H01L31/0232
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