发明名称 Semiconductor device with dielectric structure and method for fabricating the same
摘要 A semiconductor device with a dielectric structure and a method for fabricating the same are provided. A capacitor in the semiconductor device includes: a bottom electrode formed on a substrate; a first dielectric layer made of titanium dioxide (TiO2) in rutile phase and formed on the bottom electrode; and an upper electrode formed on the first dielectric layer.
申请公布号 US7786521(B2) 申请公布日期 2010.08.31
申请号 US20090359811 申请日期 2009.01.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK KI-SEON;ROH JAE-SUNG
分类号 H01L21/8234;H01L27/108 主分类号 H01L21/8234
代理机构 代理人
主权项
地址