发明名称 |
Systems and methods for inspecting a specimen with light at varying power levels |
摘要 |
Systems and methods for inspecting a specimen with light at varying power levels are provided. One system configured to inspect a specimen includes a light source configured to generate light. The system also includes a power attenuator subsystem configured to alter a power level of the light directed to the specimen during inspection between at least two power levels including a full power level and a minimum power level equal to or greater than about 10% of the full power level. In addition, the system includes a detection subsystem configured to generate output responsive to the light scattered from the specimen. The output can be used to detect defects on the specimen.
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申请公布号 |
US7787114(B2) |
申请公布日期 |
2010.08.31 |
申请号 |
US20070759092 |
申请日期 |
2007.06.06 |
申请人 |
KLA-TENCOR TECHNOLOGIES CORP. |
发明人 |
WOLTERS CHRISTIAN;MEYER JON |
分类号 |
G01N21/00 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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