发明名称 ABSORPTION SPECTROSCOPIC ANALYZER FOR SEMICONDUCTOR MANUFACTURING PROCESS
摘要 <p>PURPOSE: An optical extinction analyzing device for a semiconductor manufacturing process is provided to prevent the attaching of particles to the inside of an analyzing device. CONSTITUTION: An optical extinction analyzing device for a semiconductor manufacturing process comprises a fluid path converting mechanism(50) and a spectrophotometer(51). A fluid path converting mechanism is connected to the exhaust channel of the process chamber of the semiconductor manufacturing process. The spectrophotometer is connected to the exhaust channel. The spectrophotometer comprises cell and optical system. The spectrophotometer measures the moisture concentration among the process gas. A particle counter measuring particle is included in the process chamber. The fluid path converting mechanism comprises a controller.</p>
申请公布号 KR20100095369(A) 申请公布日期 2010.08.30
申请号 KR20100008254 申请日期 2010.01.29
申请人 SHIMADZU CORPORATION;TOKYO ELECTRON LIMITED 发明人 AKIYAMA OSAMU;AKIMOTO MASASHI;MORIYA TSUYOSHI;YAMAWAKU JUN
分类号 G01N21/15;G01N21/39;G01N1/00;G01N1/22;G01N15/06;G01N21/3554;H01L21/205;H01L21/3065 主分类号 G01N21/15
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