发明名称 Formation of Devices by Epitaxial Layer Overgrowth
摘要 Methods and structures are provided for formation of devices, e.g., solar cells, on substrates including, e.g., lattice-mismatched materials, by the use of aspect ratio trapping (ART) and epitaxial layer overgrowth (ELO). In general, in a first aspect, embodiments of the invention may include a method of forming a structure. The method includes forming a first opening in a masking layer disposed over a substrate that includes a first semiconductor material. A first layer, which includes a second semi-conductor material lattice-mismatched to the first semiconductor material, is formed within the first opening. The first layer has a thickness sufficient to extend above a top surface of the masking layer. A second layer, which includes the second semiconductor material, is formed on the first layer and over at least a portion of the masking layer. A vertical growth rate of the first layer is greater than a lateral growth rate of the first layer and a lateral growth rate of the second layer is greater than a vertical growth rate of the second layer.
申请公布号 US2010216277(A1) 申请公布日期 2010.08.26
申请号 US20090680872 申请日期 2009.09.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 FIORENZA JAMES;LOCHTEFELD ANTHONY;BAI JIE;PARK JI-SOO;HYDRICK JENNIFER;LI JIZHONG;CHENG ZHIYUAN
分类号 H01L31/18;B32B38/10;C30B25/04;H01L21/20 主分类号 H01L31/18
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