| 摘要 |
According to embodiments of the present technique, a system and a method for obtaining low-noise measurements for a wide range of analog signal strengths is provided. According to aspects of the present technique, a low-gain measurement of an input pixel charge is performed, wherein the input pixel charge is distributed to two feedback capacitors, which together provide a relatively low integrator gain. After the low-gain measurement, a high-gain measurement is performed, wherein one of the capacitors is remove from the feedback loop and the charge is redistributed to the remaining capacitor.
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