发明名称 TEST CIRCUIT, AND TEST METHOD
摘要 <P>PROBLEM TO BE SOLVED: To detect an operationally unstable differential input circuit having a small operational margin. Ž<P>SOLUTION: In a test mode in which input/output characteristics of a differential input circuit 10 is tested, the test circuit includes varies at least one of signal levels of an inverting input signal INB and a noninverting input signal INT input to the differential input circuit 10, and reduces a difference between the signal levels of the inverting input signal INB and the noninverting input signal INT more than that in a normal operation. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010187047(A) 申请公布日期 2010.08.26
申请号 JP20090028031 申请日期 2009.02.10
申请人 RENESAS ELECTRONICS CORP 发明人 OBATA HIROYUKI
分类号 H03F3/45 主分类号 H03F3/45
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