REPLACING DEFECTIVE MEMORY BLOCKS IN RESPONSE TO EXTERNAL ADDRESSES
摘要
Electronic systems and methods of operating memory devices are provided. In one such embodiment, a memory device (100) receives an external address that addresses a non-defective memory block (2103) of a sequence of memory blocks (210) of the memory device (100) in place of a defective memory block (2102) of the sequence of memory blocks (210) such that the non-defective memory block (2103) replaces the defective memory block (2102). The non-defective memory block (2103) is a proximate non-defective memory block following the defective memory block (2102) in the sequence of memory blocks (210) that is available to replace the defective memory block (2102).
申请公布号
WO2010059490(A3)
申请公布日期
2010.08.26
申请号
WO2009US64100
申请日期
2009.11.12
申请人
MICRON TECHNOLOGY, INC.;SARIN, VISHAL;NGUYEN, DZUNG H.;RADKE, WILLIAM H.