发明名称 COMPOSITION FOR CHEMICAL-MECHANICAL POLISHING SLURRY
摘要 A composition for chemical-mechanical polishing slurry is disclosed, wherein the polishing rate and selectivity with respect to a metal film are improved. The composition for chemical-mechanical polishing slurry comprises an oxidant, an anticorrosive agent, an organic acid and/or organic amino compounds, water, and one or more polishing enhancers selected from a group consisting of selenium compounds, tellurium compounds, and sulfur compounds. Preferably, the content of the polishing enhancers is 0.001 to 5 wt % of the total slurry composition, and the composition for chemical-mechanical polishing slurry has a pH level of 2 to 6.
申请公布号 WO2010077010(A3) 申请公布日期 2010.08.26
申请号 WO2009KR07719 申请日期 2009.12.23
申请人 DONGJIN SEMICHEM CO., LTD.;KIM, TAEK-RAE;KONG, HYUN-GOO;PARK, JONG-DAI 发明人 KIM, TAEK-RAE;KONG, HYUN-GOO;PARK, JONG-DAI
分类号 C09K3/14 主分类号 C09K3/14
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