发明名称 |
COMPOSITION FOR CHEMICAL-MECHANICAL POLISHING SLURRY |
摘要 |
A composition for chemical-mechanical polishing slurry is disclosed, wherein the polishing rate and selectivity with respect to a metal film are improved. The composition for chemical-mechanical polishing slurry comprises an oxidant, an anticorrosive agent, an organic acid and/or organic amino compounds, water, and one or more polishing enhancers selected from a group consisting of selenium compounds, tellurium compounds, and sulfur compounds. Preferably, the content of the polishing enhancers is 0.001 to 5 wt % of the total slurry composition, and the composition for chemical-mechanical polishing slurry has a pH level of 2 to 6. |
申请公布号 |
WO2010077010(A3) |
申请公布日期 |
2010.08.26 |
申请号 |
WO2009KR07719 |
申请日期 |
2009.12.23 |
申请人 |
DONGJIN SEMICHEM CO., LTD.;KIM, TAEK-RAE;KONG, HYUN-GOO;PARK, JONG-DAI |
发明人 |
KIM, TAEK-RAE;KONG, HYUN-GOO;PARK, JONG-DAI |
分类号 |
C09K3/14 |
主分类号 |
C09K3/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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